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https://hdl.handle.net/20.500.14094/0100476496
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2025-06-30
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0100476496 (fulltext)
pdf
1.86 MB
79
Supporting Information (other)
pdf
219 KB
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メタデータ
ファイル出力
メタデータID
0100476496
アクセス権
open access
出版タイプ
Accepted Manuscript
タイトル
Angle-, Polarization-, and Wavelength-Resolved Light Scattering of Single Mie Resonators Using Fourier-Plane Spectroscopy
著者
Hinamoto, Tatsuki ; Hamada, Mikihiko ; Sugimoto, Hiroshi ; Fujii, Minoru
著者名
Hinamoto, Tatsuki
著者名
Hamada, Mikihiko
著者ID
A2035
研究者ID
1000040793998
ORCID
0000-0002-1520-0940
KUID
https://kuid-rm-web.ofc.kobe-u.ac.jp/search/detail?systemId=ea5d85f0a07a9354520e17560c007669
著者名
Sugimoto, Hiroshi
杉本, 泰
スギモト, ヒロシ
所属機関名
工学研究科
著者ID
A1198
研究者ID
1000000273798
ORCID
0000-0003-4869-7399
KUID
https://kuid-rm-web.ofc.kobe-u.ac.jp/search/detail?systemId=c329d986b41188dd520e17560c007669
著者名
Fujii, Minoru
藤井, 稔
フジイ, ミノル
所属機関名
工学研究科
言語
English (英語)
収録物名
Advanced Optical Materials
巻(号)
9(8)
ページ
2002192
出版者
John Wiley & Sons
刊行日
2021-04-01
公開日
2022-09-27
抄録
Interference between multipole modes of Mie resonance provides the possibility to tailor a radiation pattern of a subwavelength optical resonator. Unidirectional scattering arising from constructive and destructive interferences between electric and magnetic dipolar modes in a nanoantenna allows to design a variety of metasurfaces. However, experimental determination of radiation patterns of an individual nanoobject and the decomposition into multipoles have not been performed under plane wave illumination due to the inability of angular analysis in a conventional optical microscope. To this end, an angle-, polarization-, and wavelength-resolved microscopy setup is developed in this work to measure radiation patterns of an individual nanoobject. A single spherical silicon nanosphere is employed as an ideal Mie resonator and the angle- and polarization-resolved scattering is measured in the angular range from 30° to 150° against the incident angle. It is shown that Mie scattering from the electric and magnetic dipoles of a single silicon nanosphere is selectively measured in the setup.
キーワード
back focal plane
directionality
Kerker condition
Mie resonance
multipolar interference
nanoantenna
カテゴリ
工学研究科
学術雑誌論文
権利
This is the peer reviewed version of the following article: [Hinamoto, T., Hamada, M., Sugimoto, H., Fujii, M., Angle-, Polarization-, and Wavelength-Resolved Light Scattering of Single Mie Resonators Using Fourier-Plane Spectroscopy. Adv. Optical Mater. 2021, 9, 2002192.], which has been published in final form at https://doi.org/10.1002/adom.202002192. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. This article may not be enhanced, enriched or otherwise transformed into a derivative work, without express permission from Wiley or by statutory rights under applicable legislation. Copyright notices must not be removed, obscured or modified. The article must be linked to Wiley’s version of record on Wiley Online Library and any embedding, framing or otherwise making available the article or pages thereof by third parties from platforms, services and websites other than Wiley Online Library must be prohibited.
関連情報
DOI
https://doi.org/10.1002/adom.202002192
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資源タイプ
journal article
eISSN
2195-1071
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